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dc.contributor.authorKshirsagar, Pravin R.
dc.contributor.authorManoharan, Hariprasath
dc.contributor.authorSelvarajan, Shitharth
dc.contributor.authorAlthubiti, Sara A.
dc.contributor.authorAlenezi, Fayadh
dc.contributor.authorSrivastava, Gautam
dc.contributor.authorLin, Jerry Chun-Wei
dc.date.accessioned2023-05-04T10:49:19Z
dc.date.available2023-05-04T10:49:19Z
dc.date.created2023-01-07T21:50:52Z
dc.date.issued2022
dc.identifier.citationElectronics. 2022, 11(13): 1950.en_US
dc.identifier.issn2079-9292
dc.identifier.urihttps://hdl.handle.net/11250/3066166
dc.description.abstractDue to air pollution, pollutants that harm humans and other species, as well as the environment and natural resources, can be detected in the atmosphere. In real-world applications, the following impurities that are caused due to smog, nicotine, bacteria, yeast, biogas, and carbon dioxide occur uninterruptedly and give rise to unavoidable pollutants. Weather, transportation, and the combustion of fossil fuels are all factors that contribute to air pollution. Uncontrolled fire in parts of grasslands and unmanaged construction projects are two factors that contribute to air pollution. The challenge of assessing contaminated air is critical. Machine learning algorithms are used to forecast the surroundings if any pollution level exceeds the corresponding limit. As a result, in the proposed method air pollution levels are predicted using a machine learning technique where a computer-aided procedure is employed in the process of developing technological aspects to estimate harmful element levels with 99.99% accuracy. Some of the models used to enhance forecasts are Mean Square Error (MSE), Coefficient of Determination Error (CDE), and R Square Error (RSE).en_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleA Radical Safety Measure for Identifying Environmental Changes Using Machine Learning Algorithmsen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holder© 2022 by the authors.en_US
dc.source.pagenumber19en_US
dc.source.volume11en_US
dc.source.journalElectronicsen_US
dc.source.issue13en_US
dc.identifier.doi10.3390/electronics11131950
dc.identifier.cristin2102633
dc.source.articlenumber1950en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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