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dc.contributor.authorChen, Hsing-Chung
dc.contributor.authorWidodo, Agung Mulyo
dc.contributor.authorWisnujati, Andika
dc.contributor.authorRahaman, Mosiur
dc.contributor.authorLin, Jerry Chun-Wei
dc.contributor.authorChen, Liukui
dc.contributor.authorWeng, Chien-Erh
dc.date.accessioned2023-03-22T13:12:28Z
dc.date.available2023-03-22T13:12:28Z
dc.date.created2022-04-13T14:59:04Z
dc.date.issued2022
dc.identifier.citationElectronics. 2022, 11 (6), .en_US
dc.identifier.issn2079-9292
dc.identifier.urihttps://hdl.handle.net/11250/3059881
dc.description.abstractWith limited retrieval of reserves and restricted capability in plant pathology, automation of processes becomes essential. All over the world, farmers are struggling to prevent various harm from bacteria or pathogens such as viruses, fungi, worms, protozoa, and insects. Deep learning is currently widely used across a wide range of applications, including desktop, web, and mobile. In this study, the authors attempt to implement the function of AlexNet modification architecture-based CNN on the Android platform to predict tomato diseases based on leaf image. A dataset with of 18,345 training data and 4,585 testing data was used to create the predictive model. The information is separated into ten labels for tomato leaf diseases, each with 64 × 64 RGB pixels. The best model using the Adam optimizer with a realizing rate of 0.0005, the number of epochs 75, batch size 128, and an uncompromising cross-entropy loss function, has a high model accuracy with an average of 98%, a strictness rate of 0.98, a recall value of 0.99, and an F1-count of 0.98 with a loss of 0.1331, so that the classification results are good and very precise. Keywords: AlexNet modification; tomato diseases; leaf image; AIen_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleAlexNet Convolutional Neural Network for Disease Detection and Classification of Tomato Leafen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holder© 2022 by the authorsen_US
dc.source.pagenumber0en_US
dc.source.volume11en_US
dc.source.journalElectronicsen_US
dc.source.issue6en_US
dc.identifier.doi10.3390/electronics11060951
dc.identifier.cristin2017225
dc.source.articlenumber951en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal